Manufacturer of precision stamped parts for the semiconductor industry
The client produced micro-components with tolerances of a few micrometres. Standard inspection platforms were not suitable for this product type: too large, too slow to changeover or insufficiently accurate for the required measurement specifications. The client was looking for an inspection system specifically tailored to their product and production environment.
Simac Masic developed a fully custom inspection system based on high-resolution line scan cameras, combined with structured light for dimensional measurement. The handling was specially designed for the fragile geometry of the stamped parts. The image processing algorithm combines classical dimensional inspection with AI-based surface analysis.
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